Spectrometer detector selection guide
The detector is a critical component of any spectrometer, converting the incoming light intensity into an electrical signal that can be analyzed and processed. Each pixel in the detector array corresponds to a specific wavelength, enabling the spectrometer to capture detailed spectral information across the measurement range.
Choosing the right detector is essential for achieving optimal performance, but with multiple detector technologies and configurations available, it can be challenging to identify the best option for a specific application. Factors such as wavelength range, sensitivity, speed, signal level, and measurement conditions all influence detector selection.
For most Ibsen Photonics spectrometer platforms, several detector options are available to accommodate different application requirements. This guide is designed to help you navigate the selection process and identify the detector technology that best matches the high-level characteristics of your application.
If you need assistance selecting the optimal detector for your system, our spectroscopy experts are always ready to help. Contact us to discuss your application and requirements.

Wavelength range
The required wavelength range is often the first factor in detector selection. Silicon detectors (CCD, CMOS, and NMOS) provide excellent performance from the UV and visible regions into the near-infrared, typically up to approximately 1100 nm. For measurements beyond 900 nm, and particularly above 1100 nm, InGaAs detectors are preferred.
Spectral Resolution
Applications requiring the ability to distinguish closely spaced spectral features benefit from detectors with a large number of small pixels – for example we commonly use a CMOS detector with 4096 pixels and a pixel spacing of 7 μm for high resolution spectrometer options.
Sensitivity
For low-light applications, the ability to detect weak optical signals can be improved through longer integration times and the use of detectors with high quantum efficiency and low read noise. For extended integration times, detector cooling may be required to reduce thermally generated charge carriers, commonly referred to as dark current, and the associated noise. In general, longer integration times require deeper cooling to maintain a high signal-to-noise ratio. For example, our most sensitive Raman spectrometers use a high-performance CCD detector cooled to -60 °C.
Measurement speed
Applications involving moving samples or pulsed light sources require fast and precise spectral acquisition. In these cases, detector frame rate and readout speed become important selection factors. Modern CMOS detectors often provide significantly higher frame rates than traditional CCD detectors, making them well suited for real-time measurements and high-throughput applications.
Small variations in intensity
For applications where subtle differences in spectral features must be detected and quantified, achieving a high signal-to-noise ratio (SNR) is essential. A higher SNR makes it easier to distinguish small intensity variations from measurement noise, improving the accuracy and repeatability of the results.
High SNR is typically achieved by selecting a detector with a large full-well capacity.
Large variations in intensity within the spectrum
Some applications require the simultaneous measurement of very strong and very weak spectral features within the same spectrum. In these cases, detector dynamic range becomes a critical parameter. A high dynamic range allows weak signals to be resolved without saturating on the strongest peaks.
Detectors with a large full-well capacity can store more photoelectrons in each pixel before reaching saturation. This enables the measurement of large intensity differences across the spectrum while preserving signal quality and linearity.
Common detectors for spectrometers
The table below compares common spectrometer detector technologies in terms of their usable wavelength range and typical integration times. Many of the detectors listed as examples are available across the Ibsen Photonics spectrometer portfolio, enabling the selection of the most suitable detector for a wide range of spectroscopy applications.
| UV-VIS-NIR 190-1100 nm wavelength range | NIR 900-2500 nm wavelength range | ||||
|---|---|---|---|---|---|
| Integration time | Detector type | Examples | Detector type | Examples | |
| Deep cooled CCD | Andor iVac 316 | ||||
| 10 sec | - | ||||
| 1-stage TE cooled BT-CCD | Hamamatsu S7031 series | 2-stage TE cooled InGaAs | Hamamatsu G11477 | ||
| 1 sec | - | ||||
| Non-cooled BT-CCD | Hamamatsu s10420 series | 1-stage TE cooled InGaAs | Hamamatsu G11508 | ||
| 100 msec | - | ||||
| 10 msec | - | ||||
| Non-cooled CMOS | Hamamatsu S11639 Hamamatsu S13496 Hamamatsu S14739 | Non-cooled InGaAs | Hamamatsu G11620 series Hamamatsu G13913 series | ||
| 1 msec | - | ||||
| 100 microsec | - | ||||
| 10 microsec | - | ||||
| 1 microsec | - | Non-cooled BT-CCD w. Global shutter | Hamamatsu S11156 | ||
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