I-MON 835 OEM
Cost-efficient 835 nm Interrogation Monitor for OEM integration
I-MON 835 OEM
The I-MON 835 OEM Interrogation Monitor offers real-time spectrum monitoring of FBG sensors in the 835 nm wavelength range. A high spectrometer resolution combined with a broad wavelength range provides high-resolution interrogation monitors allowing measurement of a large number of FBG sensors.
A direct interface to the CMOS array offers OEM integrators a cost efficient solution for building their FBG sensing systems.
Applications
OEM Interrogation Monitor modules:
- Vibration analysis
- Temperature measurements
- Pressure monitoring
- Strain measurements
Specifications
| Parameter | Unit | I-MON 835 OEM |
|---|---|---|
| Maximum number of FBG sensors | 45 | |
| Minimum FBG spacing | pm | 1200 |
| Wavelength range | nm | 810 - 860 |
| Wavelength fit resolution(*) | pm | < 0.5 |
| Repeatability (over any pol. state) | pm | 3 (5 max) |
| Wavelength drift (**) | pm / deg C | 1 (3 max) |
| Dynamic range (*) | dB | 30 |
| Input optical power range (*) | dBm | -80 to - 20 |
| Measurement frequency (*) | Hz | > 100 |
| Electrical interface | Direct interface to CMOS image sensor | |
| Size (LxWxD) | mm | 23x58x76 |
| Operating temperature | deg C | 0 to 70 |
(*) Depending on customer electronics.
(**) Note that by applying temperature control or temperature correction the wavelength accuracy over the entire wavelength range can be improved.
Ordering
Additional Material
A detailed Product Specification describing the electronics interface for the I-MON 835 OEM and a detailed User’s Manual for the I-MON 835 OEM Developer’s Kit are both available by clicking here.