I-MON 835 OEM
Cost-efficient 835 nm Interrogation Monitor for OEM integration
The I-MON 835 OEM Interrogation Monitor offers real-time spectrum monitoring of FBG sensors in the 835 nm wavelength range. A high spectrometer resolution combined with a broad wavelength range provides high-resolution interrogation monitors allowing measurement of a large number of FBG sensors.
A direct interface to the CMOS array offers OEM integrators a cost efficient solution for building their FBG sensing systems.
OEM Interrogation Monitor modules:
- Vibration analysis
- Temperature measurements
- Pressure monitoring
- Strain measurements
|Parameter||Unit||I-MON 835 OEM|
|Maximum number of FBG sensors||45|
|Minimum FBG spacing||pm||1200|
|Wavelength range||nm||810 - 860|
|Wavelength fit resolution(*)||pm||< 0.5|
|Repeatability (over any pol. state)||pm||3 (5 max)|
|Wavelength drift (**)||pm / deg C||1 (3 max)|
|Dynamic range (*)||dB||30|
|Input optical power range (*)||dBm||-80 to - 20|
|Measurement frequency (*)||Hz||> 100|
|Electrical interface||Direct interface to CMOS image sensor|
|Operating temperature||deg C||0 to 70|
(*) Depending on customer electronics.
(**) Note that by applying temperature control or temperature correction the wavelength accuracy over the entire wavelength range can be improved.
A detailed Product Specification describing the electronics interface for the I-MON 835 OEM and a detailed User’s Manual for the I-MON 835 OEM Developer’s Kit are both available by clicking here.