Cost-efficient 835 nm Interrogation Monitor for OEM integration
IMG_4045 - Cut resized


The I-MON 835 OEM Interrogation Monitor offers real-time spectrum monitoring of FBG sensors in the 835 nm wavelength range. A high spectrometer resolution combined with a broad wavelength range provides high-resolution interrogation monitors allowing measurement of a large number of FBG sensors.

A direct interface to the CMOS array offers OEM integrators a cost efficient solution for building their FBG sensing systems.


OEM Interrogation Monitor modules:

  • Vibration analysis
  • Temperature measurements
  • Pressure monitoring
  • Strain measurements


ParameterUnit I-MON 835 OEM
Maximum number of FBG sensors 45
Minimum FBG spacing pm1200
Wavelength rangenm810 - 860
Wavelength fit resolution(*)pm< 0.5
Repeatability (over any pol. state) pm3 (5 max)
Wavelength drift (**) pm / deg C 1 (3 max)
Dynamic range (*) dB 30
Input optical power range (*)dBm -80 to - 20
Measurement frequency (*) kHz4
Electrical interfaceDirect interface to CMOS image sensor
Size (LxWxD) mm 23x58x76
Operating temperaturedeg C0 to 70

(*) Depending on customer electronics.

(**) Note that by applying temperature control or temperature correction the wavelength accuracy over the entire wavelength range can be improved.


Request quotation here.

Additional Material

A detailed Product Specification describing the electronics interface for the I-MON 835 OEM and a detailed User’s Manual for the I-MON 835 OEM Developer’s Kit are both available by clicking here.